The 2014 International Conference on Nanoscience + Technology (ICN+T) will provide an international forum for discussion of the latest developments in nanoscale science and technology and recent advances in scanning probe microscopy and related techniques. The ICN+T represents the convergence of the former International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM) and Nano, which were first combined in Basel, Switzerland in 2006. This conference will cover a range of topics in nanoscale science and technology, addressing the interdisciplinary, international nature of this exciting and rapidly growing field.
Please find more information relating this event by following link: