Optical Metrology and a Digital Optical Technologies (DOT)

 
We would like to draw your attention to our well-known 2-year SPIE conference

Optical Metrology and a new SPIE conference Digital Optical Technologies (DOT)
 
both co-located with Laser Munich in Munich, Germany, June 26-29, 2017,  and take this opportunity to invite you to submit and present your latest research at this high-quality meetings.

The conferences links can be found by following links:

http://spie.org/conferences-and-exhibitions/optical-metrology

https://spie.org/conferences-and-exhibitions/digital-optical-technologies