Optical Metrology and a Digital Optical Technologies (DOT)
Event - Optical Metrology and a Digital Optical Technologies (DOT)
- Title:
- Optical Metrology and a Digital Optical Technologies (DOT)
- When:
- Mo, 26. Juni 2017 - Do, 29. Juni 2017
Description
We would like to draw your attention to our well-known 2-year SPIE conference
Optical Metrology and a new SPIE conference Digital Optical Technologies (DOT)
both co-located with Laser Munich in Munich, Germany, June 26-29, 2017, and take this opportunity to invite you to submit and present your latest research at this high-quality meetings.
The conferences links can be found by following links:
http://spie.org/conferences-and-exhibitions/optical-metrology
https://spie.org/conferences-and-exhibitions/digital-optical-technologies
Venue - Neue Messe München
- Location:
- Neue Messe München
- Street:
- Am Messesee
- Postcode:
- 81829
- City:
- München
- County:
- Bayern
- Country:
-
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